Sulphur-induced offsets in MC-ICP-MS silicon-isotope measurements

2009-08-01

Sulphur-induced offsets in MC-ICP-MS silicon-isotope measurements

van den Boorn, S., Vroon, P. Z. & van Bergen, M. J., 1 Aug 2009, In: Journal of Analytical Atomic Spectrometry. 24, 8, p. 1111-1114 4 p.